IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical regression for efficient high-dimensional modeling of analog and mixed-signal performance variations

2008 45th ACM/IEEE Design Automation Conference

Author(s): Xin Li ; Hongzhou Liu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Anaheim, CA, USA
Conference Date: 8 June 2008
Page(s): 38 - 43
ISBN (Paper): 978-1-60558-115-6
ISSN (Paper): 0738-100X
Regular:

The continuous technology scaling brings about high-dimensional performance variations that cannot be easily captured by the traditional response surface modeling. In this paper we propose a new... View More

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