IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simultaneous planning localization and mapping: A hybrid Bayesian/ frequentist approach

2008 American Control Conference (ACC '08)

Author(s): S. Chakravorty ; R. Saha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Seattle, WA, USA
Conference Date: 11 June 2008
Page(s): 1,226 - 1,231
ISBN (CD): 978-1-4244-2079-7
ISBN (Paper): 978-1-4244-2078-0
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2008.4586660
Regular:

In this paper, the problem of mapping and planning in an uncertain environment is studied. A hybrid Bayesian/ frequentist formulation of the simultaneous planning, localization and mapping (SPLAM)... View More

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