IEEE - Institute of Electrical and Electronics Engineers, Inc. - Diagnosability of stochastic discrete-event systems under unreliable observations

2008 American Control Conference (ACC '08)

Author(s): D. Thorsley ; Tae-Sic Yoo ; H.E. Garcia
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 June 2008
Conference Location: Seattle, WA, USA
Conference Date: 11 June 2008
Page(s): 1,158 - 1,165
ISBN (CD): 978-1-4244-2079-7
ISBN (Paper): 978-1-4244-2078-0
ISSN (Paper): 0743-1619
DOI: 10.1109/ACC.2008.4586649
Regular:

We investigate diagnosability of stochastic discrete-event systems where the observation of certain events is unreliable, that is, there are non-zero probabilities of the misdetection and... View More

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