IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Battery Tester Data Acquisition System Using LabVIEW

2008 IEEE Region 5 Conference

Author(s): M. Lockhart ; L. Clabon ; C. Lott ; M. James
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Kansas City, MO, USA
Conference Date: 17 April 2008
Page(s): 1 - 6
ISBN (CD): 978-1-4244-2077-3
ISBN (Paper): 978-1-4244-2076-6
DOI: 10.1109/TPSD.2008.4562740
Regular:

Well logging, measurement while drilling, and seismic acquisition require custom power sources. These custom power sources are safely manufactured and tested for operations in subsurface... View More

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