IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel BiST and Calibration Technique for CMOS Down-Converters

2008 4th International Conference on Circuits and Systems for Communications

Author(s): S. Rodriguez ; A. Rusu ; Li-Rong Zheng ; M. Ismail
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2008
Conference Location: Shanghai, China
Conference Date: 26 May 2008
Page(s): 828 - 832
ISBN (CD): 978-1-4244-1708-7
ISBN (Paper): 978-1-4244-1707-0
DOI: 10.1109/ICCSC.2008.181
Regular:

This paper presents a new digital calibration methodology that allows CMOS Gilbert cell down-converters to meet their block specifications under large process, temperature and power supply... View More

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