IEEE - Institute of Electrical and Electronics Engineers, Inc. - Subpixel Anomalous Change Detection in Remote Sensing Imagery

2008 IEEE Southwest Symposium on Image Analysis and Interpretation

Author(s): J. Theiler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Santa Fe, NM, USA
Conference Date: 24 March 2008
Page(s): 165 - 168
ISBN (CD): 978-1-4244-2297-5
ISBN (Paper): 978-1-4244-2296-8
DOI: 10.1109/SSIAI.2008.4512311
Regular:

A machine-learning framework for anomalous change detection is extended to the situation in which the anomalous change is smaller than a pixel. Although the existing framework can be applied to... View More

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