IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Region of Interest Detection of Spiculated Masses on Digital Mammograms

2008 IEEE Southwest Symposium on Image Analysis and Interpretation

Author(s): Rana Jahanbin ; Mehul P. Sampat ; Gautam S. Muralidhar ; Gary J. Whitman ; Alan C. Bovik ; Mia K. Markey
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Santa Fe, NM, USA
Conference Date: 24 March 2008
Page(s): 129 - 132
ISBN (CD): 978-1-4244-2297-5
ISBN (Paper): 978-1-4244-2296-8
DOI: 10.1109/SSIAI.2008.4512302
Regular:

We have developed a novel technique to automatically identify a region of interest (ROI) surrounding a spiculated lesion on a mammogram. Our proposed approach for determining the size of the ROI... View More

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