IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interpreting similarity measures: Bridging the gap between schema matching and data integration

2008 IEEE 24th International Conference on Data Engineering Workshop (ICDE Workshop)

Author(s): A. Gal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Cancun, Mexico
Conference Date: 7 April 2008
Page(s): 278 - 285
ISBN (CD): 978-1-4244-2162-6
ISBN (Paper): 978-1-4244-2161-9
DOI: 10.1109/ICDEW.2008.4498332
Regular:

It has been recognized in the literature that the process of schema matching is uncertain. Such uncertainty at the core of data integration needs to be managed correctly to avoid dire... View More

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