IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mining periodic patterns in manufacturing test data

IEEE SoutheastCon 2008

Author(s): J. Engler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Huntsville, AL, USA
Conference Date: 3 April 2008
Page(s): 389 - 395
ISBN (CD): 978-1-4244-1884-8
ISBN (Paper): 978-1-4244-1883-1
DOI: 10.1109/SECON.2008.4494325
Regular:

Mining of periodic patterns in time series databases is an important data mining problem with many applications. Previous articles have considered the mining of periodic patterns in datasets that... View More

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