IEEE - Institute of Electrical and Electronics Engineers, Inc. - Experimental results for an inductively matched microwave amplifier in a standard 0.5 micron CMOS process using four identical spiral inductors

IEEE SoutheastCon 2008

Author(s): P. Shoghi ; C.J. Barnwell ; T.P. Weldon
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2008
Conference Location: Huntsville, AL, USA
Conference Date: 3 April 2008
Page(s): 64 - 68
ISBN (CD): 978-1-4244-1884-8
ISBN (Paper): 978-1-4244-1883-1
DOI: 10.1109/SECON.2008.4494257
Regular:

Experimental results are presented for an inductively- matched microwave amplifier design in a standard 0.5 micron CMOS process. For the amplifier design, inductive source degeneration is used to... View More

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