IEEE - Institute of Electrical and Electronics Engineers, Inc. - Complexity Based Image Artifact Detection

2008 Data Compression Conference

Author(s): A. Mallet ; L. Gueguen ; M. Datcu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Snowbird, UT, USA
Conference Date: 25 March 2008
Page(s): 534
ISBN (Paper): 978-0-7695-3121-2
ISSN (Paper): 1068-0314
DOI: 10.1109/DCC.2008.33
Regular:

Images may contain blemishes or artificial structures which come from the processing or directly from the sensors, that decrease the quality of the images and can lead to analysis and... View More

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