IEEE - Institute of Electrical and Electronics Engineers, Inc. - Defect List Compression

2008 Data Compression Conference

Author(s): G. Motta ; E. Ordentlich ; M.J. Weinberger
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Snowbird, UT, USA
Conference Date: 25 March 2008
Page(s): 3 - 12
ISBN (Paper): 978-0-7695-3121-2
ISSN (Paper): 1068-0314
DOI: 10.1109/DCC.2008.96
Regular:

We consider a setting relevant to the design of storage systems in which a list of defective storage blocks, as determined at manufacture time, is stored in a high-speed system controller memory... View More

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