IEEE - Institute of Electrical and Electronics Engineers, Inc. - Evaluating Performance and Fault Tolerance in a Virtual Large-Scale Disk

2008 22nd International Conference on Advanced Information Networking and Applications

Author(s): E. Chai ; M. Uehara ; H. Mori
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Okinawa, Japan
Conference Date: 25 March 2008
Page(s): 926 - 933
ISBN (Paper): 978-0-7695-3095-6
ISSN (Paper): 1550-445X
DOI: 10.1109/AINA.2008.158
Regular:

Recently, the exchange of data has increased with progress in information technology. The capacity of for storing data is also increasing. However, even if the capacity of global storage becomes... View More

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