IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Classification of Port-Scans from Distributed Sensors

2008 22nd International Conference on Advanced Information Networking and Applications

Author(s): H. Kikuchi ; N. Fukuno ; T. Kobori ; M. Terada ; T. Pikulkaew
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Okinawa, Japan
Conference Date: 25 March 2008
Page(s): 771 - 778
ISBN (Paper): 978-0-7695-3095-6
ISSN (Paper): 1550-445X
DOI: 10.1109/AINA.2008.73
Regular:

Computer worms randomly perform port-scans to find vulnerable hosts to intrude over the Internet. Malicious software varies its port-scan strategy, e.g., some hosts intensively perform scans on a... View More

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