IEEE - Institute of Electrical and Electronics Engineers, Inc. - Mutation Testing of Protocol Messages Based on Extended TTCN-3

2008 22nd International Conference on Advanced Information Networking and Applications

Author(s): Chuanming Jing ; Zhiliang Wang ; Xingang Shi ; Xia Yin ; Jianping Wu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Okinawa, Japan
Conference Date: 25 March 2008
Page(s): 667 - 674
ISBN (Paper): 978-0-7695-3095-6
ISSN (Paper): 1550-445X
DOI: 10.1109/AINA.2008.98
Regular:

The critical requirement on reliability, fault-tolerance and security of network devices highlights the necessity of protocol robustness testing. Mutation testing of protocol messages is an... View More

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