IEEE - Institute of Electrical and Electronics Engineers, Inc. - Document History System and its Application to Abnormal Document Access Pattern Detection with a Probabilistic Model

2008 22nd International Conference on Advanced Information Networking and Applications

Author(s): Wenxing Peng ; Y. Masuda ; T. Terao ; N. Yoshida
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Okinawa, Japan
Conference Date: 25 March 2008
Page(s): 486 - 493
ISBN (Paper): 978-0-7695-3095-6
ISSN (Paper): 1550-445X
DOI: 10.1109/AINA.2008.112
Regular:

We present a design and implementation of tracing document history and its application to detecting abnormal document access patterns. We have been working on document history system, which... View More

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