IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test vector chains for increased targeted and untargeted fault coverage
13th Asia and South Pacific Design Automation Conference ASP-DAC 2008
Author(s): | I. Pomeranz ; S.M. Reddy |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2008 |
Conference Location: | Seoul, South Korea |
Conference Date: | 21 March 2008 |
Page(s): | 663 - 666 |
ISBN (CD): | 978-1-4244-1922-7 |
ISBN (Paper): | 978-1-4244-1921-0 |
DOI: | 10.1109/ASPDAC.2008.4484034 |
Regular:
We introduce the concept of test vector chains, which allows us to obtain new test vectors from existing ones through single-bit changes without any test generation effort. We demonstrate that a... View More