IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test vector chains for increased targeted and untargeted fault coverage

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): I. Pomeranz ; S.M. Reddy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 663 - 666
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4484034
Regular:

We introduce the concept of test vector chains, which allows us to obtain new test vectors from existing ones through single-bit changes without any test generation effort. We demonstrate that a... View More

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