IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust test generation for power supply noise induced path delay faults

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Xiang Fu ; Huawei Li ; Yu Hu ; Xiaowei Li
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 659 - 662
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4484033
Regular:

In deep sub-micron designs, the delay caused by power supply noise (PSN) can no longer be ignored. A PSN-induced path delay fault (PSNPDF) model is proposed in this paper, and should be tested to... View More

Advertisement