IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new low energy BIST using a statistical code

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Sunghoon Chun ; Taejin Kim ; Sungho Kang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 647 - 652
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4484031
Regular:

To tackle with the increased switching activity during the test operation, this paper proposes a new built-in self test (BIST) scheme for low energy testing that uses a statistical code and a new... View More

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