IEEE - Institute of Electrical and Electronics Engineers, Inc. - Circuit lines for guiding the generation of random test sequences for synchronous sequential circuits
13th Asia and South Pacific Design Automation Conference ASP-DAC 2008
Author(s): | I. Pomeranz ; S.M. Reddy |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 January 2008 |
Conference Location: | Seoul, South Korea |
Conference Date: | 21 March 2008 |
Page(s): | 641 - 646 |
ISBN (CD): | 978-1-4244-1922-7 |
ISBN (Paper): | 978-1-4244-1921-0 |
DOI: | 10.1109/ASPDAC.2008.4484030 |
Regular:
A procedure proposed earlier for improving the fault coverage of a random primary input sequence modifies the input sequence so as to avoid repeated synchronization of state variables. We show... View More