IEEE - Institute of Electrical and Electronics Engineers, Inc. - GECOM: Test data compression combined with all unknown response masking

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Youhua Shi ; N. Togawa ; M. Yanagisawa ; T. Ohtsuki
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 577 - 582
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4484018
Regular:

This paper introduces GECOM technology, a novel test compression method with seamless integration of test GEneration, test Compression (i.e. integrated compression on scan stimulus and masking... View More

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