IEEE - Institute of Electrical and Electronics Engineers, Inc. - Determination of optimal polynomial regression function to decompose on-die systematic and random variations

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): T. Sato ; H. Ueyama ; N. Nakayama ; K. Masu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 518 - 523
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4484006
Regular:

A procedure that decomposes measured parametric device variation into systematic and random components is studied by considering the decomposition process as selecting the most suitable model for... View More

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