IEEE - Institute of Electrical and Electronics Engineers, Inc. - A stochastic local hot spot alerting technique

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Hwisung Jung ; M. Pedram
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 468 - 473
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4483996
Regular:

With the increasing levels of variability in the behavior of manufactured nano-scale devices and dramatic changes in the power density on a chip, timely identification of hot spots on a chip has... View More

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