IEEE - Institute of Electrical and Electronics Engineers, Inc. - A debug probe for concurrently debugging multiple embedded cores and inter-core transactions in NoC-based systems

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Shan Tang ; Qiang Xu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 416 - 421
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4483986
Regular:

Existing SoC debug techniques mainly target bus-based systems. They are not readily applicable to the emerging system that use network-on-chip (NoC) as on-chip communication scheme. In this paper,... View More

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