IEEE - Institute of Electrical and Electronics Engineers, Inc. - Technology modeling and characterization beyond the 45nm node

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): S.R. Nassif
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 219
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4483944
Regular:

The semiconductor industry is unique in that it produces products with little or no prototyping! While a car company will build (and crash) many prototypes before converging on a final design,... View More

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