IEEE - Institute of Electrical and Electronics Engineers, Inc. - Dynamic supply noise measurement circuit composed of standard cells suitable for in-site SoC power integrity verification

13th Asia and South Pacific Design Automation Conference ASP-DAC 2008

Author(s): Y. Ogasahara ; M. Hashimoto ; T. Onoye
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2008
Conference Location: Seoul, South Korea
Conference Date: 21 March 2008
Page(s): 107 - 108
ISBN (CD): 978-1-4244-1922-7
ISBN (Paper): 978-1-4244-1921-0
DOI: 10.1109/ASPDAC.2008.4483917
Regular:

This paper presents an all digital measurement circuit called "gated oscillator" for capturing waveforms of dynamic power supply noise. The gated oscillator is constructed with standard cells, and... View More

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