IEEE - Institute of Electrical and Electronics Engineers, Inc. - Applying evolving fuzzy models with adaptive local error bars to on-line fault detection

2008 3rd International Workshop on Genetic and Evolving Fuzzy Systems (GEFS '08)

Author(s): E. Lughofer ; C. Guardiola
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: Witten-Bommerholz, Germany
Conference Date: 4 March 2008
Page(s): 35 - 40
ISBN (CD): 978-1-4244-1613-4
ISBN (Paper): 978-1-4244-1612-7
DOI: 10.1109/GEFS.2008.4484564
Regular:

The main contribution of this paper is a novel fault detection strategy, which is able to cope with changing system states at on-line measurement systems fully automatically. For doing so, an... View More

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