IEEE - Institute of Electrical and Electronics Engineers, Inc. - Robust Analog Design for Automotive Applications by Design Centering with Safe Operating Areas

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): U. Sobe ; K.-H. Rooch ; A. Ripp ; M. Pronath
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 848 - 854
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479849
Regular:

The effects of random variations during the manufacturing process on devices can be simulated as a variation of transistor parameters. Device degradation, due to temperature or voltage stress,... View More

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