IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Built-in Test and Characterization Method for Circuit Marginality Related Failures

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): A. Sanyal ; S. Kundu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 838 - 843
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479847
Regular:

With the advent of ultra deep-submicron (UDSM) regime of integrated circuits, the issues with circuit marginality related transient failures are on the rise. An example of such failures is the... View More

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