IEEE - Institute of Electrical and Electronics Engineers, Inc. - Two New Methods for Accurate Test Set Relaxation via Test Set Replacement

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): S. Neophytou ; M.K. Michael
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 827 - 831
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479845
Regular:

This paper presents two different techniques for relaxing a given test set by maximizing the number of unspecified bits in the test set, without compromising the fault coverage or increasing the... View More

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