IEEE - Institute of Electrical and Electronics Engineers, Inc. - Interval Based X-Masking for Scan Compression Architectures

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): A. Chandra ; R. Kapur
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 821 - 826
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479844
Regular:

Test stimulus and response compaction (scan compression) in scan is increasingly becoming an integral part of today's design-for-test (DFT) methodology for achieving high quality test at lower... View More

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