IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Basis for Formal Robustness Checking

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): G. Fey ; R. Drechsler
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 784 - 789
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479838
Regular:

Correct input/output behavior of circuits in presence of internal malfunctions becomes more and more important. But reliable and efficient methods to measure this robustness are not available yet.... View More

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