IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Design Model for Random Process Variability

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): V. Wang ; K. Agarwal ; S. Nassif ; K. Nowka ; D. Markovic
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 734 - 737
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479829
Regular:

A new approach to analyze process variation through measured current variation is introduced. The methodology concludes with a simple and convenient posynomial model for random process variability... View More

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