IEEE - Institute of Electrical and Electronics Engineers, Inc. - Process-Variation Statistical Modeling for VLSI Timing Analysis

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Jui-Hsiang Liu ; Ai-Syuan Hong ; Lumdo Chen ; C.C.P. Chen
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 730 - 733
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479828
Regular:

SSTA requires accurate statistical distribution models of non-Gaussian random variables of process parameters and timing variables. Traditional quadratic Gaussian model has been shown to have some... View More

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