IEEE - Institute of Electrical and Electronics Engineers, Inc. - Practical Clock Tree Robustness Signoff Metrics

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): A. Rajaram ; R. Damodaran ; A. Rajagopal
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 676 - 679
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479818
Regular:

Clock tree analysis and signoff is a key step in the design of any high performance chip. Though simple and intutive metrics like skew have been used to track clock tree quality, they are not... View More

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