IEEE - Institute of Electrical and Electronics Engineers, Inc. - Simulation and Measurement of On-Chip Supply Noise in Multi-Gigabit I/O Interfaces

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Hai Lan ; R. Schmitt ; Chuck Yuan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 670 - 675
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479817
Regular:

Characteristics of the on-chip power supply noise in a 6.4 Gbps serial link interface test system are analyzed by both simulation and measurement techniques. Pre- and post-layout simulation... View More

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