IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Automated Scan Chain Division Method for Shift and Capture Power Reduction in Broadside At-Speed Test

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Ho Fai Ko ; N. Nicolici
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 649 - 654
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479814
Regular:

To address the excessive power during test, multiple scan divisions can be created such that not all the circuit blocks are active at the same time. While this concept has been successfully... View More

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