IEEE - Institute of Electrical and Electronics Engineers, Inc. - Automated Standard Cell Library Analysis for Improved Defect Modeling

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): J.G. Brown ; R.D. Blanton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 643 - 648
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479813
Regular:

Inductive fault analysis techniques examine the physical geometry of a design to identify potential defect sites. Since traditional methodologies for test generation, fault simulation, and... View More

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