IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sequential Path Delay Fault Identification Using Encoded Delay Propagation Signatures

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): E. Flanigan ; A. Abdulrahman ; S. Tragoudas
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 633 - 636
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479811
Regular:

A complete function-based scheme is presented to identify at-speed sequentially untestable path delay faults. We introduce signature variables to implicitly track error propagation through... View More

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