IEEE - Institute of Electrical and Electronics Engineers, Inc. - Plenary Speech 2P2: Statistical Techniques to Achieve Robustness and Quality

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): C. Visweswariah
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 586
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479801
Regular:

Summary form only given. Variability due to manufacturing, environmental and aging uncertainties constitutes one of the major challenges in continuing CMOS scaling. Worst-case design is simply not... View More

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