IEEE - Institute of Electrical and Electronics Engineers, Inc. - Plenary Speech 2P1: Consumerization of Electronics and Nanometer Technologies: Implications for Manufacturing Test

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): S. Taneja
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 585
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479800
Regular:

Summary form only given. Test has long been recognized as the bridge between design and manufacturing. However, innovation and deep integration in design and test tools has not kept pace with the... View More

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