IEEE - Institute of Electrical and Electronics Engineers, Inc. - Statistical Models and Frequency-Dependent Corner Models for Passive Devices

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Ning Lu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 543 - 548
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479793
Regular:

We present the statistical SPICE models and associated corner models of passive devices (such as capacitors and resistors) in VLSI semiconductor technologies. The capacitor devices include... View More

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