IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Novel Cell-Based Heuristic Method for Leakage Reduction in Multi-Million Gate VLSI Designs

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): S. Gupta ; J. Singh ; A. Roy
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 526 - 530
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479790
Regular:

This paper presents a heuristic cell-based approach to reduce leakage power in multi-million gate design ASICs in 90 nm/65 nm processes by swapping low-Vt cells with high-Vt cells on less critical... View More

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