IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Holistic Approach to SoC Verification
2008 9th International Symposium on Quality Electronic Design (ISQED '08)
Author(s): | A. Strang ; D. Potts ; S. Hemmady |
Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
Publication Date: | 1 March 2008 |
Conference Location: | San Jose, CA, USA |
Conference Date: | 17 March 2008 |
Page(s): | 417 - 422 |
ISBN (Paper): | 978-0-7695-3117-5 |
DOI: | 10.1109/ISQED.2008.4479768 |
Regular:
Semiconductor designs are continuously growing in complexity. It is no longer practical to view large swaths of waveforms at one time. Dataflow and bus transactions must be presented to engineers... View More