IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Holistic Approach to SoC Verification

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): A. Strang ; D. Potts ; S. Hemmady
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 417 - 422
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479768
Regular:

Semiconductor designs are continuously growing in complexity. It is no longer practical to view large swaths of waveforms at one time. Dataflow and bus transactions must be presented to engineers... View More

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