IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analytical Noise-Rejection Model Based on Short Channel MOSFET

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): V. Jain ; P. Zarkesh-Ha
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 401 - 406
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479765
Regular:

Due to scaling down of semiconductor technology, modern deep-submicron VLSI circuits are becoming increasingly vulnerable to noise from multiple sources, including cross-talk, radiation-induced... View More

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