IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterizing the Impact of Substrate Noise on High-Speed Flash ADCs

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): P. Nikaeen ; B. Murmann ; R.W. Dutton
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 396 - 400
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479764
Regular:

A 4-bit flash ADC is investigated in presence of substrate noise generated by switching activities in digital blocks. The impact of noise is analyzed in different building blocks of the ADC and is... View More

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