IEEE - Institute of Electrical and Electronics Engineers, Inc. - The Statistical Failure Analysis for the Design of Robust SRAM in Nano-Scale Era

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Young-Gu Kim ; Soo-Hwan Kim ; Hoon Lim ; Sanghoon Lee ; Keun-Ho Lee ; Young-Kwan Park ; Moon-Hyun Yoo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 369 - 372
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479759
Regular:

Increase of the process variability with aggressive technology scaling causes many productivity issues in VLSI manufacturing. Analysis about the relationship between process variability and... View More

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