IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Randomized Greedy Algorithm for the Pattern Fill Problem for DFM Applications

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): M. Mukherjee ; K. Chakraborty
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 344 - 347
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479753
Regular:

This work deals with the dummy fill and negative fill insertion problem with constraints on the minimum and maximum pattern density within a moving rectangular window. It is shown that the general... View More

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