IEEE - Institute of Electrical and Electronics Engineers, Inc. - Hotspot Based Yield Prediction with Consideration of Correlations

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Qing Su ; Charles Chiang ; J. Kawa
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 338 - 343
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479752
Regular:

Design for manufacturability and yield has becomes a major issue for advanced VLSI technology nodes. The demand for a yield prediction capability has been growing significantly. Unfortunately,... View More

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