IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fast Timing Update under the Effect of IR Drop

2008 9th International Symposium on Quality Electronic Design (ISQED '08)

Author(s): Muzhou Shao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2008
Conference Location: San Jose, CA, USA
Conference Date: 17 March 2008
Page(s): 301 - 304
ISBN (Paper): 978-0-7695-3117-5
DOI: 10.1109/ISQED.2008.4479744
Regular:

As the IC feature size advances to nanometer, IR drop and power network noise produce significant effects on delay and signal integrity. Traditional timing analysis and closure should not be... View More

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